Neutron STEM Lab

Wave Optics Workbench

Simulate interference, diffraction, gratings, thin films, polarization, optical resolution, and coherence with unit-labeled graphs.

Wave Optics: labelled diagrams and key equations for interference, diffraction, polarization, and coherence.
Browser-local interactive workspace
Interactive workspace initializes in your browser. Engineering method, assumptions, validation, and references are available below.

Engineering reference

Wave Optics: theory, method, and sources

This optics & photonics workspace publishes 4 governing equations, 2 stated assumptions, 1 documented boundary, and 3 sources so the numbers it returns can be checked rather than taken on trust.

Calculations run locallyCalculation & source methodology

How this tool works

A physical-optics workbench that connects equations to spatial and angular intensity patterns.

All plot axes display quantities and units.

Calculators and topics covered

  • interference
  • diffraction
  • polarization
  • coherence
  • resolution
  • double slit
  • single slit
  • diffraction grating
  • thin film
  • Malus law
  • Rayleigh criterion

Core equations

Δy=λLd\Delta y = \frac{\lambda L}{d}a  sin⁡  θ=mλa\; \sin \; \theta = m\lambda I=I0  cos2θI = I_{0}\; cos^{2} \theta θ=1.22λD\theta = \frac{1.22 \lambda }{D}

Method and assumptions

Assumptions

  • Fraunhofer approximations are used for slit and grating calculations.
  • Thin-film calculations assume normal incidence and equal-amplitude qualitative interference.

Limitations and design boundaries

  • Vector diffraction, material dispersion, partial coherence propagation, and polarization phase retardance are simplified.

Sources and references

Primary sources are preferred for ratings, standards, manufacturer data, and externally defined constants.

Source policy
  • Hecht, OpticsInterference, diffraction, thin films, and polarization.
  • Born and Wolf, Principles of OpticsCoherence theory and the rigorous basis for the diffraction results.
  • Goodman, Introduction to Fourier OpticsFraunhofer far-field conditions and aperture diffraction patterns.

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